We are currently seeking experienced metrologist to work closely with our research staff to execute structural, chemical, optical, and topologic characterization with a focus on both semiconductor and optical substrates. The position is contract position for 12-36 months and requires a Bachelors in materials science, chemistry, engineering, physics, or similar. Candidates with experience in a broad set of characterization techniques are preferred.
B.S. with 3-years of experience in a metrology role or MS degree with demonstrated experience in the area of metrology.